X-Ray Stress Analysis for Polycrystalline Materials with Preferred Orientation.
نویسندگان
چکیده
منابع مشابه
X-Ray Imaging of Polycrystalline and Amorphous Materials
A novel method for obtaining position resolved information simultaneously from an entire plane of a polycrystalline or amorphous sample using the diffracted radiation or fluorescence has been developed. It makes use of a microchannelplate as a collimator in front of a position sensitive detector (CCDcamera). Experiments may be performed either in transmission or in reflection geometry. In the f...
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ژورنال
عنوان ژورنال: Journal of the Society of Materials Science, Japan
سال: 1999
ISSN: 1880-7488,0514-5163
DOI: 10.2472/jsms.48.705